Defect inspection for TFT-LCD images based on the low-rank matrix reconstruction

标题
Defect inspection for TFT-LCD images based on the low-rank matrix reconstruction
作者
关键词
Defect inspection, Low-rank matrix reconstruction, LCDs, IALM, Adaptive parameter selection
出版物
NEUROCOMPUTING
Volume 149, Issue -, Pages 1206-1215
出版商
Elsevier BV
发表日期
2014-09-16
DOI
10.1016/j.neucom.2014.09.007

向作者/读者发起求助以获取更多资源

Reprint

联系作者

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started