期刊
JOURNAL OF APPLIED PHYSICS
卷 115, 期 17, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4867119
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资金
- DARPA [N66001-11-1-4198]
The fabrication and magnetic characterization of 15-lm-thick electroplated L1(0) CoPt hard magnets with good magnetic properties is reported in this paper. Experimental study of the dependence of the magnets' properties on annealing temperature reveals that an intrinsic coercivity H-ci = similar to 800 kA/m (10 kOe), squareness >0.8, and energy product of >150 kJ/m(3) are obtained for photolithographically patterned structures (250 mu m x 2 mm stripes; 15 mu m thickness) electroplated on silicon substrates and annealed in hydrogen forming gas at 700 degrees C. Scanning electron microscopy is used to inspect the morphology of both the as-deposited and annealed magnetic layers, and X-ray Diffractometer analysis on the magnets annealed at 700 degrees C confirm a phase transformation to an ordered L1(0) CoPt structure, with a minor phase of hcp Co. These thick films are intended for microsystems/MEMS applications. (C) 2014 AIP Publishing LLC.
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