Virtual GaN substrates via Sc2O3/Y2O3 buffers on Si(111): Transmission electron microscopy characterization of growth defects

标题
Virtual GaN substrates via Sc2O3/Y2O3 buffers on Si(111): Transmission electron microscopy characterization of growth defects
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 113, Issue 22, Pages 223501
出版商
AIP Publishing
发表日期
2013-06-11
DOI
10.1063/1.4809561

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