Insulation degradation behavior of multilayer ceramic capacitors clarified by Kelvin probe force microscopy under ultra-high vacuum

标题
Insulation degradation behavior of multilayer ceramic capacitors clarified by Kelvin probe force microscopy under ultra-high vacuum
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 113, Issue 6, Pages 064103
出版商
AIP Publishing
发表日期
2013-02-14
DOI
10.1063/1.4791714

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