Investigation on interfacial thermal resistance and phonon scattering at twist boundary of silicon
出版年份 2013 全文链接
标题
Investigation on interfacial thermal resistance and phonon scattering at twist boundary of silicon
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 113, Issue 5, Pages 053513
出版商
AIP Publishing
发表日期
2013-02-07
DOI
10.1063/1.4790178
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- An atomic level study on the out-of-plane thermal conductivity of polycrystalline argon nanofilm
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