Accurate determination of interface trap state parameters by admittance spectroscopy in the presence of a Schottky barrier contact: Application to ZnO-based solar cells

标题
Accurate determination of interface trap state parameters by admittance spectroscopy in the presence of a Schottky barrier contact: Application to ZnO-based solar cells
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 113, Issue 14, Pages 144502
出版商
AIP Publishing
发表日期
2013-04-11
DOI
10.1063/1.4799633

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