4.6 Article

Surface chemistry and morphology effects on optoelectronic transport at metal/nanostructured silicon/silicon structures

期刊

JOURNAL OF APPLIED PHYSICS
卷 111, 期 9, 页码 -

出版社

AMER INST PHYSICS
DOI: 10.1063/1.4710989

关键词

-

向作者/读者索取更多资源

This work enlighten on the modification of the electrical and optoelectronic properties at metal/silicon interface, where the silicon surface is nanostructured by single step mask-less CF4 plasma in reactive ion etching mode. The electrical transport across metal/nanotextured silicon/silicon structure has been correlated with morphological variations of surface topological features and chemistry. The results evidence that such nanostructures enhance the photovoltaic behavior and affect electrical and optoelectronic transport to a different extent, depending not only on surface texturing but also on surface chemistry. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4710989]

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据