期刊
JOURNAL OF APPLIED PHYSICS
卷 111, 期 1, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3675464
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资金
- NRI (Nanoelectronics Research Initiative) through MIND (Midwest Institute of Nanoelectronics Discovery)
- DARPA
- Intel Corporation
- NSF [DMR-0084173, ECS-0348289]
- State of Florida
- DOE
We investigate the low-temperature magneto-transport properties of monolayer epitaxial graphene films formed on the Si-face of semi-insulating 4H SiC substrates by a high-temperature sublimation process. A high-k top-gate on the epitaxial graphene is realized by inserting a fully oxidized nanometer-thin aluminum film as a seeding layer, followed by an atomic layer deposition process. At low temperatures, the devices demonstrate a strong field effect by the top gate with an on/off ratio of similar to 7 and an electron mobility up to similar to 3250 cm(2)/Vs. After the observation of the half-integer quantum-Hall effect for monolayer epitaxial graphene films, detailed magneto-transport measurements have been carried out including varying densities, temperatures, magnetic fields, and currents. We study the width of the distinguishable quantum-Hall plateau to plateau transition (Landau level index n=0 to n=1) as temperature (T) and current are varied. For both gate voltage and magnetic field sweeps and T>10 K, the transition width goes as T-kappa with exponent k similar to 0.42. This universal scaling exponent agrees well with those found in III V heterojunctions with short-range alloy disorders and in exfoliated graphene. VC 2012 American Institute of Physics. [doi:10.1063/1.3675464]
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