期刊
JOURNAL OF APPLIED PHYSICS
卷 111, 期 7, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3700249
关键词
-
资金
- ministry of Education, Science and Technology
- KRF [2011-0004748]
- Yonsei University
C-60 has been used as an electron accepting and transporting material in various organic electronic devices. In such devices, Al and Ag have been adopted as a common cathode in combination with electron injection layers (EIL), e. g., LiF. We found that the initial interface formations of C-60/LiF/Al and C-60/LiF/Ag are quite different in terms of interfacial electronic structures. We measured the interfacial electronic structures with photoemission spectroscopy and found that LiF works well as an EIL on Al but performs poorly on Ag. The origin of this difference could be attributed to the larger interface dipole on Al, highlighting the importance of the choice of cathode materials. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3700249]
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