Validating Raman spectroscopic calibrations of phonon deformation potentials in silicon single crystals: A comparison between ball-on-ring and micro-indentation methods

标题
Validating Raman spectroscopic calibrations of phonon deformation potentials in silicon single crystals: A comparison between ball-on-ring and micro-indentation methods
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 110, Issue 9, Pages 093511
出版商
AIP Publishing
发表日期
2011-11-09
DOI
10.1063/1.3656447

向作者/读者发起求助以获取更多资源

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation