Structural and morphological characterization of molecular beam epitaxy grown Si/Ge multilayer using x-ray scattering techniques

Strain engineering in Si via closely stacked, site-controlled SiGe islands

(2010) J. J. Zhang et al.   APPLIED PHYSICS LETTERS

Conduction band discontinuity and electron confinement at the SixGe1−x/Ge interface

(2010) G. Mazzeo et al.   APPLIED PHYSICS LETTERS

Improvement of infrared detection using Ge quantum dots multilayer structure

(2010) M. Kolahdouz et al.   APPLIED PHYSICS LETTERS

X-ray nanodiffraction at individual SiGe/Si(001) dot molecules and its numerical description based on kinematical scattering theory

(2010) M. Dubslaff et al.   APPLIED PHYSICS LETTERS

Si/SiGe quantum cascade superlattice designs for terahertz emission

(2010) G. Matmon et al.   JOURNAL OF APPLIED PHYSICS

Quantitative strain characterization of SiGe heterostructures by high-resolution transmission electron microscopy

(2010) C.W. Zhao et al.   PHYSICA B-CONDENSED MATTER

Atomic ordering dependence on growth method in Ge:Si(001) islands: Influence of surface kinetic and thermodynamic interdiffusion mechanisms

(2010) A. Malachias et al.   PHYSICAL REVIEW B

Engineering self-assembled SiGe islands for robust electron confinement in Si

(2010) R. O. Rezaev et al.   PHYSICAL REVIEW B

Ge/Si heterostructures with coherent Ge quantum dots in silicon for applications in nanoelectronics

(2010) O P Pchelyakov et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Multiple scattering effects in strain and composition analysis of nanoislands by grazing incidence x rays

(2009) M.-I. Richard et al.   APPLIED PHYSICS LETTERS

Surface and interfacial structural characterization of MBE grown Si/Ge multilayers

(2009) Biswajit Saha et al.   APPLIED SURFACE SCIENCE

Enhanced Relaxation and Intermixing in Ge Islands Grown on Pit-Patterned Si(001) Substrates

(2009) T. U. Schülli et al.   PHYSICAL REVIEW LETTERS

Ordering of Ge islands on hill-patterned Si (001) templates

(2008) Gang Chen et al.   APPLIED PHYSICS LETTERS

Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands

(2008) C. Mocuta et al.   PHYSICAL REVIEW B