期刊
JOURNAL OF APPLIED PHYSICS
卷 107, 期 3, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3305341
关键词
carrier mobility; organic semiconductors; photoelectron spectra; space charge; time of flight spectra; ultraviolet spectra
资金
- Ontario Centres of Excellence
- Natural Sciences and Engineering Research Council of Canada
Carrier mobility is one of the most critical parameters in organic electronics. There is a strong interest in measuring the mobility of thin-film organic semiconductors using simple techniques, such as from current-voltage (I-V) measurements. This paper discusses how to extract mobility from I-V characteristics, ranging from space charge limited current (SCLC) to injection limited current (ILC). It is found that the mobility extracted from SCLC may significantly deviate from the value measured by time-of-flight depending on the contacting nature at the injection interface. Therefore, the SCLC cannot in general be used to accurately measure mobility. However, the mobility extracted from ILC, which incorporates the injection barrier height measured by ultraviolet photoelectron spectroscopy, is found to be more reliable for unknown materials systems.
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