期刊
JOURNAL OF APPLIED PHYSICS
卷 108, 期 3, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3467963
关键词
gallium compounds; III-V semiconductors; molecular beam epitaxial growth; nanorods; plasma materials processing; Raman spectroscopy; transmission electron microscopy; wide band gap semiconductors
资金
- EPSRC [EP/C537564/1]
- NPL
Resonant microwave-assisted and dc transport are investigated in degenerately doped silicon single electron transistors. A model based on hopping via localized impurity states is developed and first used to explain both the dc temperature dependence and the ac response. In particular, the non-monotonic power dependence of the resonant current under irradiation is proved to be consistent with spatial Rabi oscillations between these localized states. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3467963]
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