Comparative x-ray reflectometry and atomic force microscopy of surfaces with non-Gaussian roughness

标题
Comparative x-ray reflectometry and atomic force microscopy of surfaces with non-Gaussian roughness
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 104, Issue 6, Pages 064301
出版商
AIP Publishing
发表日期
2008-09-19
DOI
10.1063/1.2977753

向作者/读者发起求助以获取更多资源

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started