期刊
JOURNAL OF APPLIED CRYSTALLOGRAPHY
卷 46, 期 -, 页码 999-1007出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0021889813013162
关键词
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资金
- National Science Foundation [DMR-12-06707, DMR-08-56199]
- NASA [NNX09AJ19H, NNX07AK27G, NNX10AU19G]
- US DOE [DE-AC02-06CH11357]
- Division Of Materials Research
- Direct For Mathematical & Physical Scien [1206707] Funding Source: National Science Foundation
- NASA [116867, NNX09AJ19H] Funding Source: Federal RePORTER
A method for the calculation of the pair distribution and structure functions from X-ray intensity data obtained with an area detector for an off-center incident X-ray beam on an amorphous sphere is presented. Error propagation for converting from the structure function to the pair distribution function is also described, including a summation series approach to treat the error from a high-q truncation. A Zr58.5Cu15.6Ni12.8Al10.3Nb2.8 glass (Vitreloy 106a) is used to demonstrate the techniques. In particular, the semi-analytical corrections presented to calculate the effects of secondary scatter within and asymmetric transmission through a spherical sample are verified.
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