Characterization of the structural defects in CVD-grown monolayered MoS2using near-field photoluminescence imaging

标题
Characterization of the structural defects in CVD-grown monolayered MoS2using near-field photoluminescence imaging
作者
关键词
-
出版物
Nanoscale
Volume 7, Issue 28, Pages 11909-11914
出版商
Royal Society of Chemistry (RSC)
发表日期
2015-06-11
DOI
10.1039/c5nr02897c

向作者/读者发起求助以获取更多资源

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now