期刊
JOURNAL OF ALLOYS AND COMPOUNDS
卷 509, 期 41, 页码 9719-9723出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2011.07.099
关键词
Dielectric constant; Semiconductor; Grain boundary
资金
- CICYT [MAT2010-21088-C03-0, MAT2010-21088-C03-01/03]
- JAE-DOC
In this work, the dielectric behaviour and capacitance-voltage (C-V) curves under an applied DC bias field of 1 wt% Nb-doped CaCu3Ti4O12 ceramics have been studied. The dielectric properties reveal the existence of grain boundaries of different electrical nature. A new model is proposed to simultaneously explain the presence of insulating and conducting grain boundaries. At low frequency, the capacity curve of the material exhibits a double metal oxide semiconductor (MOS) capacitor-like behaviour and as the frequency is increased, the curve suffers an inversion showing a ferroelectric-like response. This behaviour does not correspond to ferroelectric domain movement phenomena but seems associated to charge accumulation on grain boundary regions. (C) 2011 Elsevier B.V. All rights reserved.
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