Electron-backscattered diffraction and transmission electron microscopy study of post-creep Ti3SiC2

标题
Electron-backscattered diffraction and transmission electron microscopy study of post-creep Ti3SiC2
作者
关键词
-
出版物
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 488, Issue 1, Pages 181-189
出版商
Elsevier BV
发表日期
2009-08-26
DOI
10.1016/j.jallcom.2009.08.073

向作者/读者发起求助以获取更多资源

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now