Raman microscopy mapping for the purity assessment of chirality enriched carbon nanotube networks in thin-film transistors

标题
Raman microscopy mapping for the purity assessment of chirality enriched carbon nanotube networks in thin-film transistors
作者
关键词
Raman spectroscopy, carbon nanotubes, thin film transistors, microscopy mapping, purity assessment
出版物
Nano Research
Volume 8, Issue 7, Pages 2179-2187
出版商
Springer Nature
发表日期
2015-05-07
DOI
10.1007/s12274-015-0725-y

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