Investigation of Band-Offsets at Monolayer–Multilayer MoS2 Junctions by Scanning Photocurrent Microscopy

标题
Investigation of Band-Offsets at Monolayer–Multilayer MoS2 Junctions by Scanning Photocurrent Microscopy
作者
关键词
-
出版物
NANO LETTERS
Volume 15, Issue 4, Pages 2278-2284
出版商
American Chemical Society (ACS)
发表日期
2015-03-26
DOI
10.1021/nl504311p

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