期刊
NANO LETTERS
卷 15, 期 4, 页码 2257-2262出版社
AMER CHEMICAL SOC
DOI: 10.1021/nl504182w
关键词
Noncontact atomic force microscopy (NC-AFM); submolecular resolution; three-dimensional dynamic force spectroscopy; high-resolution imaging
类别
资金
- Japanese Ministry for Education, Science, and Technology through International Center for Young Scientist (ICYS) program
- Charles University [GAUK 339311]
- Charles University-NIMS International Cooperative Graduate School Program
- Kao Foundation for Arts and Sciences
- MEXT KAKENHI [26104540]
- NIMS [AA002, AF006]
- Grants-in-Aid for Scientific Research [26104540] Funding Source: KAKEN
Submolecular imaging by atomic force microscopy (AFM) has recently been established as a stunning technique to reveal the chemical structure of unknown molecules, to characterize intramolecular charge distributions and bond ordering, as well as to study chemical transformations and intermolecular interactions. So far, most of these feats were achieved on planar molecular systems because high-resolution imaging of three-dimensional (3D) surface structures with AFM remains challenging. Here we present a method for high-resolution imaging of nonplanar molecules and 3D surface systems using AFM with silicon cantilevers as force sensors. We demonstrate this method by resolving the step-edges of the (101) anatase surface at the atomic scale by simultaneously visualizing the structure of a pentacene molecule together with the atomic positions of the substrate and by resolving the contour and probe-surface force field on a C-60 molecule with intramolecular resolution. The method reported here holds substantial promise for the study of 3D surface systems such as nanotubes, clusters, nanoparticles, polymers, and biomolecules using AFM with high resolution.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据