4.8 Article

Simultaneous Thermoelectric and Optoelectronic Characterization of Individual Nanowires

期刊

NANO LETTERS
卷 15, 期 12, 页码 8129-8135

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acs.nanolett.5b03572

关键词

Nanowires; GaN; GaN/AlGaN; photocurrent; thermoelectric; photogating

资金

  1. U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division
  2. New Mexico State University
  3. U.S. Department of Energy (DOE) Office of Science [DE-AC52-06NA25396]
  4. Sandia National Laboratories [DE-AC04-94AL85000]
  5. U.S. Department of Energy's National Nuclear Security Administration [DE-AC04-94AL85000]

向作者/读者索取更多资源

Semiconducting nanowires have been explored for a number of applications in optoelectronics such as photodetectors and solar cells. Currently, there is ample interest in identifying the mechanisms that lead to photoresponse in nanowires in order to improve and optimize performance. However, distinguishing among the different mechanisms, including photovoltaic, photothermoelectric, photoemission, bolometric, and photoconductive, is often difficult using purely optoelectronic measurements. In this work, we present an approach for performing combined and simultaneous thermoelectric and optoelectronic measurements on the same individual nanowire. We apply the approach to GaN/AlGaN core/shell and GaN/AlGaN/GaN core/shell/shell nanowires and demonstrate the photothermoelectric nature of the photocurrent observed at the electrical contacts at zero bias, for above- and below-bandgap illumination. Furthermore, the approach allows for the experimental determination of the temperature rise due to laser illumination, which is often obtained indirectly through modeling. We also show that under bias, both above- and below-bandgap illumination leads to a photoresponse in the channel with signatures of persistent photoconductivity due to photogating. Finally, we reveal the concomitant presence of photothermoelectric and photogating phenomena at the contacts in scanning photocurrent microscopy under bias by using their different temporal response. Our approach is applicable to a broad range of nanomaterials to elucidate their fundamental optoelectronic and thermoelectric properties.

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