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Successful Growth of Conductive Highly Crystalline Sn-Doped α-Ga2O3 Thin Films by Fine-Channel Mist Chemical Vapor Deposition

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JAPAN SOC APPLIED PHYSICS
DOI: 10.1143/JJAP.51.040207

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  1. Grants-in-Aid for Scientific Research [22760232, 23560408] Funding Source: KAKEN

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Highly crystalline alpha-phase gallium oxide (Ga2O3) thin films were grown by fine-channel mist chemical vapor deposition on c-sapphire substrates at 400 degrees C at a deposition rate of more than 20 nm/min. The thin films were doped with Sn(IV) atoms, which were obtained from Sn(II) chloride by the reaction SnCl2 + H2O2 + 2HCl -> SnCl4 + 2H(2)O. Conductive alpha-phase Ga2O3 thin films were successfully grown from source solutions containing less than 10 at.% Sn(IV). The source solution containing 4 at.% Sn(IV) resulted in obtaining a thin film with an n-type conductivity as high as 0.28 Scm(-1), a mobility of 0.23 cm(2) V-1 s(-1), a carrier concentration of 7 x 10(18) cm(-3), and a full width at half maximum (FWHM) of the (0006) reflection X-ray rocking curve as low as 64 arcsec. (C) 2012 The Japan Society of Applied Physics

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