期刊
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
卷 370, 期 -, 页码 66-74出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ijms.2014.06.031
关键词
Sub-eV deposition; Soft-landing; Ion mobility; Surface enhanced Raman; MALDI; Preparative mass spectrometry
资金
- SRC-Center for Electronic Materials Processing and Integration Grant [2017.015]
- DOD-AFOSR-YIP Grant [FA 9550-08-1-0153]
- Toulouse Graduate School at the University of North Texas
Sub-eV ion deposition via soft-landing ion mobility has been utilized for a variety of applications. It has allowed for the deposition of a dielectric material onto graphene without introducing defects into the lattice structure. This deposition technique has also been used for surface enhanced Raman studies. Deposited silver has also been used as an alternative MALDI matrix for low mass compounds and shows promise for imaging applications. (C) 2014 Elsevier B.V. All rights reserved.
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