Atomic Resolution Imaging of Black Spot Defects in Ion Irradiated Silicon Carbide

标题
Atomic Resolution Imaging of Black Spot Defects in Ion Irradiated Silicon Carbide
作者
关键词
-
出版物
MICROSCOPY AND MICROANALYSIS
Volume 21, Issue S3, Pages 1337-1338
出版商
Cambridge University Press (CUP)
发表日期
2016-12-08
DOI
10.1017/s1431927615007473

向作者/读者发起求助以获取更多资源

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search