Effects of surface passivation on top-down ZnO nanowire transistors

标题

作者

关键词

Depletion mode, Field effect transistor, Nanowire, Remote plasma atomic layer deposition (RPALD), Passivation, ZnO

出版物

Volume 145, Issue -, Pages 91-95

出版商

Elsevier BV

发表日期

2015-03-31

DOI

10.1016/j.mee.2015.03.013

联系作者

Discuss science. Find collaborators. Network.

Join a conversation

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now