期刊
INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
卷 50, 期 9-12, 页码 1033-1039出版社
SPRINGER LONDON LTD
DOI: 10.1007/s00170-010-2567-9
关键词
Automatic inspection; Template matching; Electronic assembly system; Wavelet transformation
资金
- Ministry of Education, Science Technology (MEST)
- Korea Industrial Technology Foundation (KOTEF)
- National Research Foundation of Korea [과C6B1621] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
The paper presents a new image template matching method for component inspection of electronic assembly systems. To recognize incorrectly assembled components, the input image of the components is matched with standard images, using a template matching algorithm. To produce a rapid inspection system, the processing time of the matching algorithm should be minimized. Since the standard images of all components located in a PCB are stored in the computer, it is desirable to minimize the memory size of the standard image. The discrete wavelet transformation is applied to minimize the image size as well as the processing time. Only 7% memory of the BMP image is used to discriminate between how well, or not, the components have been assembled. Comparative results are presented to verify the usefulness of the new proposed method.
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