A Template Model for Defect Simulation for Evaluating Nondestructive Testing in X-Radiography

标题
A Template Model for Defect Simulation for Evaluating Nondestructive Testing in X-Radiography
作者
关键词
-
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2009-01-21
DOI
10.1109/tsmca.2008.2009941

向作者/读者发起求助以获取更多资源

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started