Reliability Demonstration for Long-Life Products Based on Degradation Testing and a Wiener Process Model

出版年份 2014 全文链接

标题

作者

关键词

出版物

Volume 63, Issue 3, Pages 781-797

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2014-04-22

DOI

10.1109/tr.2014.2315938

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