Two-Stage Cost-Sensitive Learning for Software Defect Prediction

标题
Two-Stage Cost-Sensitive Learning for Software Defect Prediction
作者
关键词
-
出版物
IEEE TRANSACTIONS ON RELIABILITY
Volume 63, Issue 2, Pages 676-686
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2014-04-22
DOI
10.1109/tr.2014.2316951

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