Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process

出版年份 2012 全文链接

标题

作者

关键词

出版物

Volume 61, Issue 1, Pages 50-67

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2012-02-01

DOI

10.1109/tr.2011.2182221

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