4.3 Article

Measurements of Secondary Electron Emission from Dielectric Window Materials

期刊

IEEE TRANSACTIONS ON PLASMA SCIENCE
卷 41, 期 8, 页码 2117-2122

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TPS.2013.2265498

关键词

Desorbed gas property; dielectric window; high power microwave (HPM); insulating material; secondary electron emission (SEE)

资金

  1. National High Technology Research and Development Program of China
  2. China National Funds for Distinguished Young Scientists [51125029]
  3. National Natural Science Foundation of China [50937004, 51107096]

向作者/读者索取更多资源

Dielectric window is an important component of high-power microwave (HPM) devices. However, surface breakdown easily occurs at the vacuum/dielectric interface when HPM pass through the dielectric window. This greatly limits transmission of HPM and makes the window a bottle neck of HPM technology development. Secondary electron emission (SEE) from dielectric window plays an important role in its surface breakdown. This paper studies the total SEE (including true secondary electrons and backscattered electrons) coefficients of several inorganic and organic dielectric materials including polytetrafluoroethylene, polyethylene, alumina ceramic, and machinable ceramic. The measurements are implemented by using pulsed electron beam impacting the materials with energies from 200 eV to 5 keV. In addition, surface desorbed gas property is studied with the quadrupole mass spectrometer. The performances of different materials are evaluated. The obtained results are useful for the selection of HPM window materials.

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