Total Ionizing Dose Effects in MOS and Low-Dose-Rate-Sensitive Linear-Bipolar Devices

标题
Total Ionizing Dose Effects in MOS and Low-Dose-Rate-Sensitive Linear-Bipolar Devices
作者
关键词
-
出版物
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 60, Issue 3, Pages 1706-1730
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2013-06-04
DOI
10.1109/tns.2013.2259260

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