Total Dose Radiation Response of NROM-Style SOI Non-Volatile Memory Elements

标题
Total Dose Radiation Response of NROM-Style SOI Non-Volatile Memory Elements
作者
关键词
-
出版物
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 55, Issue 6, Pages 3202-3205
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2009-01-21
DOI
10.1109/tns.2008.2007566

向作者/读者发起求助以获取更多资源

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started