4.6 Article

Compact empirical modeling of nonlinear dynamic thermal effects in electron devices

期刊

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMTT.2008.2001956

关键词

behavioral modeling; electrothermal; electrothermal effects; heterojunction bipolar transistors (HBTs); intermodulation distortion; microwave field-effect transistors (FETs); modeling; nonlinear; self-heating; semiconductor device thermal factors; thermal; thermal impedance; Volterra series

资金

  1. Italian Ministry of Research and Higher Education (MIUR)
  2. Information Society Technologies Program of the European Union

向作者/读者索取更多资源

An original empirical approach to deal with nonlinear dynamic thermal effects in electron devices is proposed. The new technology-independent approach is very compact and easy to implement in computer-aided design tools. Therefore, it can be easily coupled with electrical device models in order to obtain accurate electrothermal models that are suitable for nonconstant-envelope RF applications (e.g., pulsed radar). Model equations and identification procedures are derived in this paper. Validation results and comparison with simplified models are also presented both for a simulated field-effect transistor device, as well as for a real heterojunction bipolar transistor device.

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