Fully Current-Based Sub-Bandgap Optoelectronic Differential Ideality Factor Technique and Extraction of Subgap DOS in Amorphous Semiconductor TFTs

出版年份 2014 全文链接

标题

作者

关键词

出版物

Volume 61, Issue 10, Pages 3566-3569

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2014-09-09

DOI

10.1109/ted.2014.2348592

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