A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

出版年份 2014 全文链接

标题

作者

关键词

出版物

Volume 61, Issue 9, Pages 3118-3124

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2014-08-20

DOI

10.1109/ted.2014.2341315

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