4.6 Article

Slant Field Plate Model for Field-Effect Transistors

期刊

IEEE TRANSACTIONS ON ELECTRON DEVICES
卷 61, 期 8, 页码 2867-2872

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2014.2329475

关键词

Electric field effects; field-effect transistors (FETs); high-voltage techniques; power semiconductor devices; semiconductor device breakdown; transistors

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The simplified field plate model for field-effect transistors previously introduced is further developed to allow arbitrary transition angles between gate and field plate or adjacent field plates. The model shows that transition angles less than 30 degrees (measured from the surface) can result in significant improvements in electric field management.

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