A Physical Model of the Temperature Dependence of the Current Through $\hbox{SiO}_{2}\hbox{/}\hbox{HfO}_{2}$ Stacks

出版年份 2011 全文链接

标题

作者

关键词

出版物

Volume 58, Issue 9, Pages 2878-2887

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2011-07-14

DOI

10.1109/ted.2011.2158825

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