Statistics of Resistance Drift Due to Structural Relaxation in Phase-Change Memory Arrays

标题
Statistics of Resistance Drift Due to Structural Relaxation in Phase-Change Memory Arrays
作者
关键词
-
出版物
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 57, Issue 10, Pages 2690-2696
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2010-08-25
DOI
10.1109/ted.2010.2058771

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