Defect Generation at Charge-Passivated $\hbox{Si}$–$\hbox{SiO}_{2}$ Interfaces by Ultraviolet Light

出版年份 2010 全文链接

标题

作者

关键词

出版物

IEEE TRANSACTIONS ON ELECTRON DEVICES

Volume 57, Issue 8, Pages 1996-2004

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2010-07-01

DOI

10.1109/ted.2010.2051199

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IEEE TRANSACTIONS ON ELECTRON DEVICES

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