Pulsed $I_{d}$– $V_{g}$ Methodology and Its Application to Electron-Trapping Characterization and Defect Density Profiling

标题
Pulsed $I_{d}$– $V_{g}$ Methodology and Its Application to Electron-Trapping Characterization and Defect Density Profiling
作者
关键词
-
出版物
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 56, Issue 6, Pages 1322-1329
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2009-05-20
DOI
10.1109/ted.2009.2019384

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