Matching the Transconductance Characteristics of CMOS ISFET Arrays by Removing Trapped Charge

标题
Matching the Transconductance Characteristics of CMOS ISFET Arrays by Removing Trapped Charge
作者
关键词
-
出版物
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 55, Issue 4, Pages 1074-1079
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2008-03-28
DOI
10.1109/ted.2008.916680

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