期刊
IEEE TRANSACTIONS ON AUTOMATIC CONTROL
卷 55, 期 8, 页码 1893-1899出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TAC.2010.2049280
关键词
Atomic force microscope (AFM) control; parameter space method; repetitive control; robust performance
A parameter space procedure for designing chosen parameters of a repetitive controller to satisfy a robust performance criterion is presented. Using this method, low-order robust repetitive controllers can be designed and implemented for plants that possibly include time delay, poles on the imaginary axis and discontinuous weights. A design and simulation study based on a high speed atomic force microscope position control example is utilized to illustrate the method presented in this paper.
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