AlGaN/GaN HFET reliability

标题
AlGaN/GaN HFET reliability
作者
关键词
-
出版物
IEEE MICROWAVE MAGAZINE
Volume 10, Issue 4, Pages 116-127
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2009-05-20
DOI
10.1109/mmm.2009.932286

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