Sampling Circuits That Break the kT/C Thermal Noise Limit - Peeref

标题

Sampling Circuits That Break the kT/C Thermal Noise Limit

作者

关键词

-

出版物

IEEE JOURNAL OF SOLID-STATE CIRCUITS

Volume 49, Issue 8, Pages 1694-1701

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2014-05-14

DOI

10.1109/jssc.2014.2320465

向作者/读者发起求助以获取更多资源

Protocol

Reagent

Reprint

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

© Peeref 2019-2024. All rights reserved.