期刊
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS
卷 17, 期 6, 页码 1614-1620出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSTQE.2011.2114643
关键词
Optical interconnection; power dissipation; reliability; vertical-cavity surface-emitting laser (VCSEL)
资金
- National Institute of Information and Communications Technology, Japan
1060-nm VCSELs with low power dissipation and high reliability are demonstrated. We designed 1060-nm VCSELs with double intracavity structure to achieve high reliability and low power dissipation for the optical interconnection. We performed evaluations of an error-free 10-Gbps operation at low bias current, and the recorded low power dissipation per data rate of 0.14 mW/Gbps was achieved. Even though the modulation amplitude of the input signal was as small as 75 mV(p-p), the extinction ratio of 6.5 dB was observed. From accelerating aging tests with 4898 devices, no random failure was observed, and high reliability of 30 failures in term (FITs)/channel with a confidence level of 90% was achieved.
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