期刊
IEEE JOURNAL OF QUANTUM ELECTRONICS
卷 48, 期 5, 页码 678-687出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JQE.2012.2189757
关键词
Dielectric-loaded plasmonic waveguide; finite element method; optical waveguide junction; silicon-on-insulator waveguides
资金
- European FP7 Project PLATON [249135]
- Heracleitus II
- European Union
- National Strategic Reference Framework
A comprehensive theoretical analysis of end-fire coupling between dielectric-loaded surface plasmon polariton and rib/wire silicon-on-insulator (SOI) waveguides is presented. Simulations are based on the 3-D vector finite element method. The geometrical parameters of the interface are varied in order to identify the ones leading to optimum performance, i.e., maximum coupling efficiency. Fabrication tolerances about the optimum parameter values are also assessed. In addition, the effect of a longitudinal metallic stripe gap on coupling efficiency is quantified, since such gaps have been observed in fabricated structures.
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