EOT Scaling of ${\rm TiO}_{2}/{\rm Al}_{2}{\rm O}_{3}$ on Germanium pMOSFETs and Impact of Gate Metal Selection

出版年份 2013 全文链接

标题

作者

关键词

出版物

Volume 34, Issue 6, Pages 732-734

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2013-05-21

DOI

10.1109/led.2013.2259137

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