期刊
IEEE ELECTRON DEVICE LETTERS
卷 33, 期 6, 页码 791-793出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2012.2190132
关键词
Atomic layer deposition (ALD); current density (J(e)); high-kappa integration; InAs; MOSFET; nanowire; on-current (I-ON); scaling; subthreshold swing (SS); transconductance (g(m))
资金
- Swedish Foundation for Strategic Research (SSF)
- Swedish Research Council (VR)
- VINNOVA
- Nanometer Structure Consortium at Lund University
- Knut and Alice Wallenberg Foundation
In this letter, we present a 15-nm-diameter InAs nanowire MOSFET with excellent on and off characteristics. An n-i-n doping profile was used to reduce the source and drain resistances, and an Al2O3/HfO2 bilayer was introduced in the high-kappa process. The nanowires exhibit high drive currents, up to 1.25 A/mm, normalized to the nanowire circumference, and current densities up to 34 MA/cm(2) (V-D = 0.5 V). For a nominal L-G = 100 nm, we observe an extrinsic transconductance (g(m)) of 1.23 S/mm and a subthreshold swing of 93 mV/decade at V-D = 10 mV.
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