4.6 Article

High-Performance InAs Nanowire MOSFETs

期刊

IEEE ELECTRON DEVICE LETTERS
卷 33, 期 6, 页码 791-793

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2012.2190132

关键词

Atomic layer deposition (ALD); current density (J(e)); high-kappa integration; InAs; MOSFET; nanowire; on-current (I-ON); scaling; subthreshold swing (SS); transconductance (g(m))

资金

  1. Swedish Foundation for Strategic Research (SSF)
  2. Swedish Research Council (VR)
  3. VINNOVA
  4. Nanometer Structure Consortium at Lund University
  5. Knut and Alice Wallenberg Foundation

向作者/读者索取更多资源

In this letter, we present a 15-nm-diameter InAs nanowire MOSFET with excellent on and off characteristics. An n-i-n doping profile was used to reduce the source and drain resistances, and an Al2O3/HfO2 bilayer was introduced in the high-kappa process. The nanowires exhibit high drive currents, up to 1.25 A/mm, normalized to the nanowire circumference, and current densities up to 34 MA/cm(2) (V-D = 0.5 V). For a nominal L-G = 100 nm, we observe an extrinsic transconductance (g(m)) of 1.23 S/mm and a subthreshold swing of 93 mV/decade at V-D = 10 mV.

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